|
Consortium of integrated circuit designers, developers, and
manufacturers; promotes standards for 3D ICs. (2010)
Standard die stacking; rebuilt wafer stacking. No TSVs.
Research on 3D read-only memory chips.
Research on wafer thinning, stacking. 2009, research (with SUSS) on
temporary bonding.
Research (with SEMATECH) on wafer thinning & thin wafer handling.
Research on wafer stacking, interconnects, and wafer-scale heterogeneous 3D
integration; partner with SEMATECH and many other research groups. (3-D
ASIP 2005)
Research on thru-silicon vias (TSV). (IMAPS 2007 & 2008, DTIP 2008,
3-D ASIP 2008)
Research (with IMEC) on 3D integration technology based on
wafer-level processing. (IMAPS 2008)
Research on 3D cell phone transmit module. (3-D ASIP 2004)
3D-related packaging and TSV research (3-D ASIP 2008, Semicon West
2009)
 | ASET
(Association of Super-Advanced Electronic Technologies) |
Japanese consortium. Developed a bulk wafer stacking process with Cu-Sn eutectic
bonds and 10 um vias, successfully demonstrated on CCD wafers. (Effort ended in 2004.)
Research on 3D sensors (with Sanyo Electric), chip-to-chip bonding, technology used in
CCD camera; research on design, test, and simulation of 3D structures.
(3-D ASIP 2004
& 2007; 3D-SIC 2007).
Research (with Albany & SEMATECH) in metallization of TSVs.
Developing 3D-IC design tools; announced working 3D design flow (with
AutoESL). (2010)
Developing 3D-IC design tools; announced working 3D design flow (with
Atrenta). (2010)
Research on 3D memories and image sensors, using wafer stacking with metal bonding.
(3-D ASIP 2006 & 2009)
Research (with EVG) on bonding/debonding technologies (3-D ASIP 2008, WLP 2008)
Research on 3D-IC sensors; hosted & chaired Front-End Electronics
2009.
Research on 3D IC design tools. (3-D ASIP 2004, 2005, 2007)
Research on many 3D-IC technologies; collaboration with R3Logic.
(2010)
Research on 3D pixel sensors (Front-End Electronics 2009)
Research on 3D wafer-level low-temperature circuit layering using SOI wafers; 3D
electronic integration; crosstalk & heat issues; 3D FPGAs. Four-layer stack announced
in 2005. ( VMIC 2004 thru 2007)
 | DARPA
(Defense Advanced Research Projects Agency) |
Funds special research, including 3D IC process technology, heterogeneous integration,
3D architectures, stacked FPGAs, and a "vertically
interconnected sensor array" (VISA) with die-on-wafer stacking and
polymer adhesive bonding. Funded two "multi-project wafer" (MPW)
runs, each with 3 stacked wafers; preliminary results in 2006 show some
parts are functional. Funding new MPW runs in 2009. (3-D ASIP 2004 & 2005; VMIC
2007)
Research (with EMC-3D) on die bonding. (IMAPS 2008)
Precision processing tools for grinding, polishing, dicing. (3D-SIC
2007, IMAPS 2009)
Research on 3D ICs (DATE 2009)
Research on materials for WLP, 3D, and TSV. (IMAPS 2008)
Research on high-density memories;, via-first, back-bumping, interposer layer, and
interface chip. Teamed with Powertech Technology (PTI) and United
Microelectronics Corporation (UMC) (2010)
 | EMC3D (Semiconductor 3D
Equipment and Materials Consortium) |
A consortium of tech, tool, and materials companies; research into
lower costs for chip stacking with
thru-silicon vias. 2009: announced program extension to July 2011,
expanded goals include both via-last and via-middle techniques for reliability
and even lower cost. (IMAPS 2007 & 2009)
Research on Z-axis interconnect. (DATE 2009)
 | ESI (Electro Scientific
Industries) |
Research on 3D-IC packaging and tools. (Semicon West 2009)
Research on TSV. (VMIC 2008)
 | FCRP (Focus Center
Research Program, also MARCO) |
Funds and operates research centers; its Interconnect Focus Center
participates in 3D efforts. (3-D ASIP 2004)
Research on 3D components, particularly sensors and detectors;
sponsors multi-participant research projects; sponsored Pixel 2008;
2009, sponsoring a 3D MPW (multi-project wafer) with other particle
detector groups.
(Front-End Electronics 2009)
Research on 3D imagers. (ISSCC 2009)
Research on vertical system integration, chip-in-polymer stacking, die-on-wafer
stacking with solder bonds, flexible substrates, and 3D components (sensors, CPUs,
memories). New research facility, ASSID, announced in 2009. (3-D ASIP 2005 & 2007, MRS 2006, 3D-SIC 2007, IMAPS
2007 thru 2009; IITC 2008, VMIC 2008, DATE 2009)
Research on wafer-to-wafer bonding techniques. (3-D ASIP 2005,
2006, 2008; IITC 2007; IMAPS 2008 & 2009; VMIC 2008)
Research on stacking techniques and 3D sensors. (3-D ASIP 2004)
Research on physical design, design tools, micro-architecture, thermal and
interconnect issues, and testing in 3D ICs. Research (with SRC) on 3D interconnect
and packaging. (VMIC 2008, DATE 2009)
Research on 3D architectures, thermal issues, routing, reliability,
etc. Many papers and publications.
 | GSA (Global
Semiconductor Alliance) |
Research to foster adoption of 3D, especially interfaces and
standards. (3-D ASIP 2009)
2009: Research on adhesives for temporary and permanent wafer
bonding.
Research on 3D integration technologies, especially wafer stacking
with TSV. (3-D ASIP 2007, IMAPS 2008 & 2009)
Research on wafer-level stacking of SOI wafers using oxide fusion bonding; Cu bonding; and
die-on-wafer stacking, mounting small dies onto a larger
"motherboard" die. Interconnects have been created on 4-wafer
mechanical stacks. In 2007, announced a chip-stacked power amplifier
with 100 direct metal connections. Other research on 3D
design tools, test structures, methodology, process, infrastructure, TSV.
(3-D ASIP
2004, 2005, 2007-2009; VMIC 2005 thru 2008; MRS 2006; 3D-SIC 2007; IMAPS
2007; SEMATECH 2008; GBC 2009)
Research on many aspects of 3D IC technology including fluidic
cooling, microbumps, bonding, die stacking, optical interconnects, etc.
(EPTC 2008)
 | IMEC
(Interuniversity MicroElectronics Center) |
Research on many 3D-IC approaches and technologies, including design
issues. (2010)
Die-on-die "chip sandwich" stacking, using diffusion soldering, micro-bump
bonding. Technique demonstrated in 2002; prototype security chip-card demonstrated November
2004; chip-stacked tire sensor in 2009. Also two-level die-on-wafer memory stacking and deep vias (with
Fraunhofer). (3-D ASIP 2004 & 2007, MRS 2006, 3D-SIC 2007, ISSCC
2009).
Research on stacking, 3D interconnects, 3D components,
copper bonding, design issues. Simulations of two-level processors indicate 15% speed improvement
plus 15% power reduction. 2007, exploring through-silicon vias and 3D
Flash. Also, research on stacking
memory onto processor. (VMIC 2004 & 2008, MRS 2006, 3-D ASIP 2007 &
2008; GBC 2009, IMAPS 2009, Semicon West 2009, 3-D ASIP 2009)
Research on 3D-IC active pixel sensors (Front-End Electronics 2009)
 | ipdia (spun off from
NXP Semiconductor in 2009) |
Research on integrated passives in 3D ICs. (IMAPS 2008, 3-D
ASIP 2009)
Research on 3D IC process technology and thermal issues, 3D modular system integration,
interconnects by die-edge metallization and thru-silicon (not thru-die)
vias; 3D imagers. (3-D ASIP 2004 & 2005, 3D-SIC 2007, VMIC 2007
& 2008, IMAPS 2008, ISSCC 2009)
Research (with EMC-3D) on wafer thinning for 3D stacking.
Research on 3D integration via Multi-Layer Organic (MLO™)
technology. (IMAPS 2008).
Working on 3D stacked IC design tools and technology with IMEC and
Qualcomm. (2008)
Research on models, tools,
& support for 3D integrated designs. (3-D ASIP 2006)
 | KAIST (Korea Advanced
Institute for Science and Technology) |
Research (with Georgia Tech and Fraunhofer) on interposer layers for
3D iCs.
Research in substrates for vertical interconnect. (VMIC 2006)
Research into 3D for high performance computing; 3D interconnect; heterogeneous
integration with covalent bonding; aluminum through-silicon vias have achieved aspect
ratios of 16:1. (3-D ASIP 2005, VMIC 2006)
Research on laser processes for creating TSV.
Research on three-layer SOI wafer bonding with silicon handle, low-temperature oxide
bonding, and W vias done last; participated in several DARPA MPWs; 3D image sensors and radar
sensors; first image sensor tests in 2005; reported working devices in 2008.
(3-D ASIP 2005 & 2009, VMIC 2006 & 2007, MRS 2006 & 2008, ISSCC
2009)
Research on adhesives for 3D ICs.
 | LSI-EPFL (Integrated
Systems Lab, Federal Polytechnic of Lausanne) |
Research on clock and power distribution in 3D ICs (DATE 2009)
Research on 3D-IC high-energy particle detectors (Front-End
Electronics 2009)
 | MCNC
Research & Development Institute |
Research on through-wafer 3D vertical interconnect (copper and optical), integrated
passives, heterogeneous integration, vertical sensor arrays; working on various government
and corporate programs. (3-D ASIP 2005)
Research in adhesives for 3D ICs. (IMAPS 2008)
Research on 3D memory using thru-wafer interconnects, a redistribution
layer, solder balls, and epoxy encapsulation. Demonstrated 2-die stack. (MRS
2006, 3-D ASIP 2008)
Research on 3D IC layout methodology, wafer stacking, high-density interconnect,
copper bonding, oxide fusion bonding, using various types of
wafers. Two-wafer stacks were announced in 1999; sensor design in 2001;
four-wafer stacks in 2005. (IAB 2004; 3-D ASIP 2004 & 2005; MRS 2006; 3D-SIC 2007)
Research on 3D stacking, sensors, memories, and packaging. (3-D ASIP 2004)
 | National Technology University, Singapore |
Research on hybrid copper/ILD bonding. (VMIC 2008)
Research on chip stacking, TSVs, 3D memory. 2009: announced nickel
TSVs. (ISSCC 2009, Semicon West 2009)
Research on thermal management for 3D ICs
Research (with SEMATECH) on 3D interconnect.
Research on 3D interconnect networks, architectures, & design
rules. Working with DARPA; SRC award for research. (VMIC 2006 & 2007,
3-D ASIP 2006, 2008, 2009)
Research on IR thermal microscopy for 3D circuits. (IMAPS 2008)
Research on thru-silicon vias (TSV). (WLP 2008)
Research on using Aerosol Jet® material deposition system for
vertical interconnect.
Research on wafer-level bumping and assembly (Front-End Electronics
2009)
Research into 3D design and toolsets. (3-D ASIP 2006, DATE 2009)
Research into TSVs, including filling with Cu pastes (MRS 2008)
Research on 3D IC packaging technologies; teamed with Elpida and
United Microelectronics Corporation (UMC). (2010)
Research on 3D IC design management and flow, thermal issues,
verification and synthesis tools; lead contractor for DARPA project
(2004).
Research on silicon layering, epitaxial growth.
Research on 3D memory with TSVs.
Research (with IMEC) on 3D design tools & technologies. (2010)
Research on wafer stacking/bonding/thinning with standard wafers and/or
SOI; dielectric
adhesives for low-temperature bonding; magnetic alignment; copper bond pads; 3D power
delivery; 3D SOI SRAMs; 3D optical interconnect. Interconnect process announced in 2003.
(3-D ASIP 2004 thru 2007; VMIC 2004 thru 2008; MRS 2006; IMAPS 2008
& 2009)
Research (with IMEC) on die-to-die and die-to-wafer bonding and (with
CEA-Leti) on metal processes for 3D. (Semicon West 2008, 2009)
Research on multi-layer memories, wafer-scale stacking. (3-D ASIP
2004, IMAPS 2008)
Research (with IBM) on novel materials for 3D ICs. (GBC 2009, IMAPS
2009)
Research on 3D die-to-wafer integration with polymer and Cu/Sn bonding;
polygeneous integration; vertically integrated sensors and coherent light
devices; working with DARPA. (3-D ASIP 2005 thru 2009; MRS 2006 &
2008; 3D-SIC 2007; VMIC 2007; IMAPS 2008, Pixel 2008)
Research (with SEMATECH) on process characterization to improve
process control for manufacturing of stacked 3D ICs, especially TSV
production.
Research on chip-on-chip and chip-on-wafer stacking for high-density
memory; thru-silicon vias (TSV), micro-bumps. 8-chip NAND stack (prototype) announced in
2005; Flash and DRAM prototypes in 2006; 4 level chip-stacked DDR3 in
2009. (3-D ASIP 2005 thru 2007, ISSCC 2009)
Research on tungsten TSV. (ECTC 2009)
Research on 3D sensors.
Research on filling TSVs.
Research on testing & monitoring 3D assembly. (3-D ASIP 2008)
Fosters research on many 3D-IC issues; organizes
symposiums and conferences; maintains semiconductor industry roadmap
(2010)
Research on end-use market drivers for 3D components. (3-D ASIP 2004)
Research on 3D packaging. (3-D ASIP 2004)
 | SI2 (Silicon Integration
Initiative) |
Research to improve interoperability and integration across silicon
design flows. (3-D ASIP 2009)
Research on wafer-level circuit stacking, mostly SOI wafers, using handler wafers and
silicon oxide bonding. 2009: announced Smart Stacking™, low-temp
transfer of thinned layers; also working on direct metal bonds; working
with IBM on thinning & bonding for 3D image sensor technology;
working with CEA-Leti on coupled oxide 3-D process; research on gallium
nitride and other substrates for bonding. (Semicon West 2009, 3-D ASIP
2009)
Research on imaging stacked wafer pairs to detect bond defects.
 | SRC
(Semiconductor Research Corporation) Research consortium |
Coordinates academic "pre-competitive" research, including 3D
process structures and 3D integration. (3-D ASIP 2005)
Research on 3D for mobile phones and full 3D-IC integration for
wireless technology. (3-D ASIP 2009)
Research on 3D IC interconnects, integrity, performance, epitaxial growth, thermal
issues, hybrid devices, 3D FPGAs, etc. (Great Lakes
Symposium of VLSI, International Symposium on System Designs (ISPD), and
IAB,
all in 2004; VMIC 2004 thru 2007; 3-D ASIP 2004 thru 2006)
Research on thru-silicon vias, micro-bumping, wafer thinning and bonding, 3D wafer
level integration. (3-D ASIP 2004, 2006, 2007, 2009; IMAPS 2007 &
2008)
Research on wafer-level and chip-level alignment; covalent bonding;
vertical communication bit-rates; 3D CMOS image sensors. 2009: announced 3D-IC demonstrator (with
CEA-Leti). (3-D ASIP 2006, IITC 2007, IMAPS 2008
& 2009, DATE 2009)
Research on 3D interconnect: power, bandwidth, architectures. (3-D
ASIP 2004)
Research on design tools. (3-D ASIP 2008, BrightSpots 2009)
Research on chip-in-polymer technology. (MRS 2006, IMAPS 2007 &
2008)
Research on 3D chip-scale packaging. Hosted 3D packaging symposium in
2003. (3-D ASIP 2004 & 2007, IMAPS 2009, Semicon West 2009)
Research on 3D technology including wafer stacking with adhesive and micro-bump
bonds, and die-to-wafer bonding with self-assembly; developed a
3D
artificial retina, various 3-layer chips (with Mitsubishi, MIT, ZyCube). (VMIC
2004 & 2008, 3-D ASIP 2005, MRS 2008, IITC 2008)
Research (with SEMATECH) on 3D interconnect.
Research on chip-stacking with copper bump bonding and through vias; 3D memory cells
and CCDs (tested 2005); inter-level "crossbar" technology, 3D
NAND Flash, 3D cache systems. (3-D ASIP
2004 thru 2007, VMIC 2008, ISSCC 2009, DATE 2009)
 | TSMC (Taiwan
Semiconductor Manufacturing Company) |
Research on 3D-IC fabrication, design, packaging, and testing. (2010)
 | UCLA (VLSI CAD LAB group) |
Research on 3D thermal-aware design tools (with DARPA, CFDRC). (VMIC 2006)
3D foundry research; teamed with Elpida and PowerTech. (2010)
Research on integrated system development for 3D VLSI. (IMAPS 2008
& 2009)
Research on vertically integrated pixel detector (Front-End
Electronics 2009)
Research on 3D-IC sensors (Front-End Electronics 2009)
Research on 3D-IC active pixel sensors (Front-End Electronics 2009)
Research on 3D sensors and detectors. (Pixel 2008, Front-End
Electronics 2009)
Research on TSV, clock & power distribution in 3D ICs. (VMIC
2008, DATE 2009, 3-D ASIP 2009)
Research on 3D NAND Flash (ISSCC 2009)
Research on wafer stacking; vertical connectors are applied to the die edges.
(3-D ASIP 2007)
Research on die stacking, 3D programmable "system-in-package" devices;
working with DARPA. (3-D ASIP 2006, 2008)
Back to Page Contents
|